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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iecon/LiNWSLL23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dan_Sun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haipan_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Han_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Heng_Nian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Meng_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yaoxin_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIECON51785.2023.10311719>
foaf:homepage <https://doi.org/10.1109/IECON51785.2023.10311719>
dc:identifier DBLP conf/iecon/LiNWSLL23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIECON51785.2023.10311719 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Over-Modulation Risk Evaluation Method in Impedance Measurement for Peak-Value Constrain. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dan_Sun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haipan_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Han_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Heng_Nian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Meng_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yaoxin_Wang>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iecon/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iecon/LiNWSLL23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iecon/LiNWSLL23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iecon/iecon2023.html#LiNWSLL23>
rdfs:seeAlso <https://doi.org/10.1109/IECON51785.2023.10311719>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iecon>
dc:title Over-Modulation Risk Evaluation Method in Impedance Measurement for Peak-Value Constrain. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document