[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iecon/MolenaarKSB23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aditya_Shekhar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Faezeh_Kardan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Margo_Molenaar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pavol_Bauer>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIECON51785.2023.10312731>
foaf:homepage <https://doi.org/10.1109/IECON51785.2023.10312731>
dc:identifier DBLP conf/iecon/MolenaarKSB23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIECON51785.2023.10312731 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Power and Thermal Cycling Testbed for End of Life Assessment of Semiconductor Devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aditya_Shekhar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Faezeh_Kardan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Margo_Molenaar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pavol_Bauer>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iecon/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iecon/MolenaarKSB23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iecon/MolenaarKSB23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iecon/iecon2023.html#MolenaarKSB23>
rdfs:seeAlso <https://doi.org/10.1109/IECON51785.2023.10312731>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iecon>
dc:title Power and Thermal Cycling Testbed for End of Life Assessment of Semiconductor Devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document