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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iecon/NuanprasertBS15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Somchai_Nuanprasert>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sueki_Baba>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Suzuki>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIECON.2015.7392610>
foaf:homepage <https://doi.org/10.1109/IECON.2015.7392610>
dc:identifier DBLP conf/iecon/NuanprasertBS15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIECON.2015.7392610 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label An efficient method of occluded solder ball segmentation for automated BGA void defect inspection using X-ray images. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Somchai_Nuanprasert>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sueki_Baba>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Suzuki>
swrc:pages 3308-3313 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iecon/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iecon/NuanprasertBS15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iecon/NuanprasertBS15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iecon/iecon2015.html#NuanprasertBS15>
rdfs:seeAlso <https://doi.org/10.1109/IECON.2015.7392610>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iecon>
dc:title An efficient method of occluded solder ball segmentation for automated BGA void defect inspection using X-ray images. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document