[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ieeehpcs/SandSF10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dietmar_Fey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matthias_Sand>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Volkmar_Sieh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FHPCS.2010.5547139>
foaf:homepage <https://doi.org/10.1109/HPCS.2010.5547139>
dc:identifier DBLP conf/ieeehpcs/SandSF10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FHPCS.2010.5547139 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Nano-technology aware investigations on fault-masking techniques in the presence of high fault probabilities. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dietmar_Fey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matthias_Sand>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Volkmar_Sieh>
swrc:pages 181-187 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ieeehpcs/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ieeehpcs/SandSF10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ieeehpcs/SandSF10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ieeehpcs/ieeehpcs2010.html#SandSF10>
rdfs:seeAlso <https://doi.org/10.1109/HPCS.2010.5547139>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ieeehpcs>
dc:title Nano-technology aware investigations on fault-masking techniques in the presence of high fault probabilities. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document