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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ieeesensors/DelhayeRAFF21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Denis_Flandre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Laurent_A._Francis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nicolas_Andr%E2%88%9A%C2%A9>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nicolas_Roisin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thibault_P._Delhaye>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FSENSORS47087.2021.9639730>
foaf:homepage <https://doi.org/10.1109/SENSORS47087.2021.9639730>
dc:identifier DBLP conf/ieeesensors/DelhayeRAFF21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FSENSORS47087.2021.9639730 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Denis_Flandre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Laurent_A._Francis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nicolas_Andr%E2%88%9A%C2%A9>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nicolas_Roisin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thibault_P._Delhaye>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ieeesensors/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ieeesensors/DelhayeRAFF21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ieeesensors/DelhayeRAFF21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ieeesensors/ieeesensors2021.html#DelhayeRAFF21>
rdfs:seeAlso <https://doi.org/10.1109/SENSORS47087.2021.9639730>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ieeesensors>
dc:title Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document