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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ieem/SitcharangsieP23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sakraan_Sitcharangsie>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Suwit_Paengkanya>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIEEM58616.2023.10407024>
foaf:homepage <https://doi.org/10.1109/IEEM58616.2023.10407024>
dc:identifier DBLP conf/ieem/SitcharangsieP23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIEEM58616.2023.10407024 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Optimizing Durian Chip Quality Using Machine Learning: Multiple Linear Regression for Predicting Inputs in Microwave-Hot Air Drying Process. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sakraan_Sitcharangsie>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Suwit_Paengkanya>
swrc:pages 1677-1681 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ieem/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ieem/SitcharangsieP23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ieem/SitcharangsieP23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ieem/ieem2023.html#SitcharangsieP23>
rdfs:seeAlso <https://doi.org/10.1109/IEEM58616.2023.10407024>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ieem>
dc:title Optimizing Durian Chip Quality Using Machine Learning: Multiple Linear Regression for Predicting Inputs in Microwave-Hot Air Drying Process. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document