Web-Based Environment for Digital Electronics Test Tools.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ifip5-5/IvaskRUS04
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Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ifip5-5/IvaskRUS04
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Schneider
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Eero_Ivask
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jaan_Raik
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Raimund_Ubar
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1007%2F1-4020-8139-1%5F46
>
foaf:
homepage
<
https://doi.org/10.1007/1-4020-8139-1_46
>
dc:
identifier
DBLP conf/ifip5-5/IvaskRUS04
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1007%2F1-4020-8139-1%5F46
(xsd:string)
dcterms:
issued
2004
(xsd:gYear)
rdfs:
label
Web-Based Environment for Digital Electronics Test Tools.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Schneider
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Eero_Ivask
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jaan_Raik
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Raimund_Ubar
>
swrc:
pages
435-442
(xsd:string)
dcterms:
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<
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>
owl:
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<
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>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ifip5-5/IvaskRUS04
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ifip5-5/ifip5-5-2004.html#IvaskRUS04
>
rdfs:
seeAlso
<
https://doi.org/10.1007/1-4020-8139-1_46
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ifip5-5
>
dc:
title
Web-Based Environment for Digital Electronics Test Tools.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document