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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Carsten_Tietje>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michele_Turitto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Richard_K._Leach>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ronaldo_Ronaldo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Svetan_M._Ratchev>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-0-387-77405-3%5F1>
foaf:homepage <https://doi.org/10.1007/978-0-387-77405-3_1>
dc:identifier DBLP conf/ifip5-5/TietjeLTRR08 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-0-387-77405-3%5F1 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Application of a DF¬ĶA Methodology to facilitate the assembly of a Micro/Nano Measurement Device. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Carsten_Tietje>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michele_Turitto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Richard_K._Leach>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ronaldo_Ronaldo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Svetan_M._Ratchev>
swrc:pages 5-12 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ifip5-5/2008ipas>
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rdfs:seeAlso <https://doi.org/10.1007/978-0-387-77405-3_1>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ifip5-5>
dc:title Application of a DF¬ĶA Methodology to facilitate the assembly of a Micro/Nano Measurement Device. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document