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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ifita/HouCW09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chenglin_Wen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yandong_Hou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhiguo_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIFITA.2009.502>
foaf:homepage <https://doi.org/10.1109/IFITA.2009.502>
dc:identifier DBLP conf/ifita/HouCW09 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIFITA.2009.502 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Assessment of Surface Contamination of High Voltage Insulator Based on Evidence Theory. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chenglin_Wen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yandong_Hou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhiguo_Chen>
swrc:pages 185-188 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ifita/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ifita/HouCW09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ifita/HouCW09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ifita/ifita2009-3.html#HouCW09>
rdfs:seeAlso <https://doi.org/10.1109/IFITA.2009.502>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ifita>
dc:subject Evidence theory, High voltage insulator, Uncertainty, fuzzy, Assessment of surface contamination (xsd:string)
dc:title Assessment of Surface Contamination of High Voltage Insulator Based on Evidence Theory. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document