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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iiaiaai/KawaguchiMWIIU23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chihiro_Ikuta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masashi_Kawaguchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masayoshi_Umeno>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Naohiro_Ishii>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ryusei_Watanabe>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuta_Morimitsu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIIAI-AAI59060.2023.00062>
foaf:homepage <https://doi.org/10.1109/IIAI-AAI59060.2023.00062>
dc:identifier DBLP conf/iiaiaai/KawaguchiMWIIU23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIIAI-AAI59060.2023.00062 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Fabric Defect Detection System using YOLO. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chihiro_Ikuta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masashi_Kawaguchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masayoshi_Umeno>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Naohiro_Ishii>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ryusei_Watanabe>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuta_Morimitsu>
swrc:pages 277-280 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iiaiaai/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iiaiaai/KawaguchiMWIIU23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iiaiaai/KawaguchiMWIIU23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iiaiaai/iiaiaai2023.html#KawaguchiMWIIU23>
rdfs:seeAlso <https://doi.org/10.1109/IIAI-AAI59060.2023.00062>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iiaiaai>
dc:title Fabric Defect Detection System using YOLO. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document