Neural Network Inverse Model for Quality Monitoring - Application to a High Quality Lackering Process.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ijcci/ThomasSZHTN17
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ijcci/ThomasSZHTN17
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Thomas_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Emmanuel_Zimmermann
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hind_Bril_El_Haouzi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/M%E2%88%9A%C2%A9lanie_Noyel
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Marie-Christine_Suhner
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Philippe_Thomas_0001
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.5220%2F0006485901860191
>
foaf:
homepage
<
https://doi.org/10.5220/0006485901860191
>
dc:
identifier
DBLP conf/ijcci/ThomasSZHTN17
(xsd:string)
dc:
identifier
DOI doi.org%2F10.5220%2F0006485901860191
(xsd:string)
dcterms:
issued
2017
(xsd:gYear)
rdfs:
label
Neural Network Inverse Model for Quality Monitoring - Application to a High Quality Lackering Process.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Thomas_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Emmanuel_Zimmermann
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hind_Bril_El_Haouzi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/M%E2%88%9A%C2%A9lanie_Noyel
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Marie-Christine_Suhner
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Philippe_Thomas_0001
>
swrc:
pages
186-191
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ijcci/2017
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ijcci/ThomasSZHTN17/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ijcci/ThomasSZHTN17
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ijcci/ijcci2017.html#ThomasSZHTN17
>
rdfs:
seeAlso
<
https://doi.org/10.5220/0006485901860191
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ijcci
>
dc:
title
Neural Network Inverse Model for Quality Monitoring - Application to a High Quality Lackering Process.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document