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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/imw2/LeeJYJWLLHCSKKK21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Changmin_Jeon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/DalHwan_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dong-Hwee_Hwang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dong-Hyun_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ga-Young_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gun_Rae_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyun-Jin_Shin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/HyunChang_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaehun_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jongsung_Woo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kyongsik_Yeom>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Minji_Seo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/MyeongHee_Oh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sangjin_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Soomin_Cho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sungyoung_Yoon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yong_Kyu_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yong_Seok_Chung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongsik_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Young_Ki_Hong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Youngcheon_Jeong>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIMW51353.2021.9439602>
foaf:homepage <https://doi.org/10.1109/IMW51353.2021.9439602>
dc:identifier DBLP conf/imw2/LeeJYJWLLHCSKKK21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIMW51353.2021.9439602 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Highly Reliable 28nm Embedded Flash Process Development for High-Density and High-Speed Automotive Grade-1 Application. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Changmin_Jeon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/DalHwan_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dong-Hwee_Hwang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dong-Hyun_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ga-Young_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gun_Rae_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyun-Jin_Shin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/HyunChang_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaehun_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jongsung_Woo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kyongsik_Yeom>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Minji_Seo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/MyeongHee_Oh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sangjin_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Soomin_Cho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sungyoung_Yoon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yong_Kyu_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yong_Seok_Chung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongsik_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Young_Ki_Hong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Youngcheon_Jeong>
swrc:pages 1-3 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/imw2/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/imw2/LeeJYJWLLHCSKKK21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/imw2/LeeJYJWLLHCSKKK21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/imw2/imw2021.html#LeeJYJWLLHCSKKK21>
rdfs:seeAlso <https://doi.org/10.1109/IMW51353.2021.9439602>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/imw2>
dc:title Highly Reliable 28nm Embedded Flash Process Development for High-Density and High-Speed Automotive Grade-1 Application. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document