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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/imw2/MarkovFSLJK23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexander_Kotov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gilles_Festes>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Louisa_Schneider>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Serguei_Jourba>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steven_Lemke>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Viktor_Markov>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIMW56887.2023.10145950>
foaf:homepage <https://doi.org/10.1109/IMW56887.2023.10145950>
dc:identifier DBLP conf/imw2/MarkovFSLJK23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIMW56887.2023.10145950 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexander_Kotov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gilles_Festes>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Louisa_Schneider>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Serguei_Jourba>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steven_Lemke>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Viktor_Markov>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/imw2/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/imw2/MarkovFSLJK23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/imw2/MarkovFSLJK23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/imw2/imw2023.html#MarkovFSLJK23>
rdfs:seeAlso <https://doi.org/10.1109/IMW56887.2023.10145950>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/imw2>
dc:title Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document