[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/imw2/PesicPRBSASL22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexander_L._Shluger>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andrea_Padovani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bastien_Beltrando>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jack_Strand>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luca_Larcher>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Milan_Pesic>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Parnika_Agrawal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tommaso_Rollo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIMW52921.2022.9779245>
foaf:homepage <https://doi.org/10.1109/IMW52921.2022.9779245>
dc:identifier DBLP conf/imw2/PesicPRBSASL22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIMW52921.2022.9779245 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Variability and disturb sources in ferroelectric 3D NANDs and comparison to Charge-Trap equivalents. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexander_L._Shluger>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andrea_Padovani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bastien_Beltrando>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jack_Strand>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Luca_Larcher>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Milan_Pesic>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Parnika_Agrawal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tommaso_Rollo>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/imw2/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/imw2/PesicPRBSASL22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/imw2/PesicPRBSASL22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/imw2/imw2022.html#PesicPRBSASL22>
rdfs:seeAlso <https://doi.org/10.1109/IMW52921.2022.9779245>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/imw2>
dc:title Variability and disturb sources in ferroelectric 3D NANDs and comparison to Charge-Trap equivalents. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document