Extreme Temperature (> 200 ¬įC), Radiation Hard (> 1 Mrad), Dense (sub-50 nm CD), Fast (2 ns write pulses), Non-Volatile Memory Technology.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/imw2/SuryavanshiYIHR22
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Extreme Temperature (> 200 ¬įC), Radiation Hard (> 1 Mrad), Dense (sub-50 nm CD), Fast (2 ns write pulses), Non-Volatile Memory Technology.
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Extreme Temperature (> 200 ¬įC), Radiation Hard (> 1 Mrad), Dense (sub-50 nm CD), Fast (2 ns write pulses), Non-Volatile Memory Technology.
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