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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iolts/AktoufPLT02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Beno%E2%88%9A%C4%A3t_Pannetier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chouki_Aktouf>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pierre_Lema%E2%88%9A%C4%A3tre-Auger>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Smail_Tedjini>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FOLT.2002.1030214>
foaf:homepage <https://doi.org/10.1109/OLT.2002.1030214>
dc:identifier DBLP conf/iolts/AktoufPLT02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FOLT.2002.1030214 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label On-line Testing of Embedded Systems Using Optical Probes: System Modeling and Probing Technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Beno%E2%88%9A%C4%A3t_Pannetier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chouki_Aktouf>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pierre_Lema%E2%88%9A%C4%A3tre-Auger>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Smail_Tedjini>
swrc:pages 191 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iolts/ioltw2002.html#AktoufPLT02>
rdfs:seeAlso <https://doi.org/10.1109/OLT.2002.1030214>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iolts>
dc:title On-line Testing of Embedded Systems Using Optical Probes: System Modeling and Probing Technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document