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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iolts/AlordaCPS04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bartomeu_Alorda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ivan_de_Pa%E2%88%9A%C4%BCl>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaume_Segura_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vicent_Canals>
foaf:homepage <http://dx.doi.org/doi.ieeecomputersociety.org%2F10.1109%2FIOLTS.2004.1>
foaf:homepage <https://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.1>
dc:identifier DBLP conf/iolts/AlordaCPS04 (xsd:string)
dc:identifier DOI doi.ieeecomputersociety.org%2F10.1109%2FIOLTS.2004.1 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label A BIST-based Charge Analysis for Embedded Memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bartomeu_Alorda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ivan_de_Pa%E2%88%9A%C4%BCl>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaume_Segura_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vicent_Canals>
swrc:pages 199-206 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iolts/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iolts/AlordaCPS04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iolts/AlordaCPS04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iolts/iolts2004.html#AlordaCPS04>
rdfs:seeAlso <https://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.1>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iolts>
dc:subject Current based testing, charge based testing, Embedded memories test, built-in current monitors (xsd:string)
dc:title A BIST-based Charge Analysis for Embedded Memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document