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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iolts/AlordaPSM00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bartomeu_Alorda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ivan_de_Pa%E2%88%9A%C4%BCl>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaume_Segura_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/T._Miller>
foaf:homepage <http://dx.doi.org/doi.ieeecomputersociety.org%2F10.1109%2FOLT.2000.856617>
foaf:homepage <https://doi.ieeecomputersociety.org/10.1109/OLT.2000.856617>
dc:identifier DBLP conf/iolts/AlordaPSM00 (xsd:string)
dc:identifier DOI doi.ieeecomputersociety.org%2F10.1109%2FOLT.2000.856617 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bartomeu_Alorda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ivan_de_Pa%E2%88%9A%C4%BCl>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaume_Segura_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/T._Miller>
swrc:pages 87-91 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iolts/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iolts/AlordaPSM00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iolts/AlordaPSM00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iolts/ioltw2000.html#AlordaPSM00>
rdfs:seeAlso <https://doi.ieeecomputersociety.org/10.1109/OLT.2000.856617>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iolts>
dc:title On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document