Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/iolts/AzaisBCDDBF0KLL20
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/iolts/AzaisBCDDBF0KLL20
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Arnaud_Virazel
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bastien_Deveautour
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bruno_Rouzeyre
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Emanuele_Valea
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Florence_Aza%E2%88%9A%C4%AEs
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois_Lef%E2%88%9A%C2%AEvre
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hassan_El_Badawi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Laurent_Latorre
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mariane_Comte
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Marie-Lise_Flottes
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Serge_Bernard
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sophie_Dupuis
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/T._Vayssade
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Vincent_Kerz%E2%88%9A%C2%AErho
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FIOLTS50870.2020.9159723
>
foaf:
homepage
<
https://doi.org/10.1109/IOLTS50870.2020.9159723
>
dc:
identifier
DBLP conf/iolts/AzaisBCDDBF0KLL20
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FIOLTS50870.2020.9159723
(xsd:string)
dcterms:
issued
2020
(xsd:gYear)
rdfs:
label
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Arnaud_Virazel
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bastien_Deveautour
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bruno_Rouzeyre
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Emanuele_Valea
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Florence_Aza%E2%88%9A%C4%AEs
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois_Lef%E2%88%9A%C2%AEvre
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hassan_El_Badawi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Laurent_Latorre
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mariane_Comte
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Marie-Lise_Flottes
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Serge_Bernard
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sophie_Dupuis
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/T._Vayssade
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Vincent_Kerz%E2%88%9A%C2%AErho
>
swrc:
pages
1-4
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/iolts/2020
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/iolts/AzaisBCDDBF0KLL20/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/iolts/AzaisBCDDBF0KLL20
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/iolts/iolts2020.html#AzaisBCDDBF0KLL20
>
rdfs:
seeAlso
<
https://doi.org/10.1109/IOLTS50870.2020.9159723
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/iolts
>
dc:
title
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document