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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iolts/AzaisBCDDBF0KLL20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arnaud_Virazel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bastien_Deveautour>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bruno_Rouzeyre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Emanuele_Valea>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Florence_Aza%E2%88%9A%C4%AEs>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois_Lef%E2%88%9A%C2%AEvre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hassan_El_Badawi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Laurent_Latorre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mariane_Comte>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marie-Lise_Flottes>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Serge_Bernard>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sophie_Dupuis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/T._Vayssade>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vincent_Kerz%E2%88%9A%C2%AErho>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIOLTS50870.2020.9159723>
foaf:homepage <https://doi.org/10.1109/IOLTS50870.2020.9159723>
dc:identifier DBLP conf/iolts/AzaisBCDDBF0KLL20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIOLTS50870.2020.9159723 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arnaud_Virazel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bastien_Deveautour>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bruno_Rouzeyre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Emanuele_Valea>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Florence_Aza%E2%88%9A%C4%AEs>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois_Lef%E2%88%9A%C2%AEvre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hassan_El_Badawi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Laurent_Latorre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mariane_Comte>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marie-Lise_Flottes>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Serge_Bernard>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sophie_Dupuis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/T._Vayssade>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vincent_Kerz%E2%88%9A%C2%AErho>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iolts/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iolts/AzaisBCDDBF0KLL20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iolts/AzaisBCDDBF0KLL20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iolts/iolts2020.html#AzaisBCDDBF0KLL20>
rdfs:seeAlso <https://doi.org/10.1109/IOLTS50870.2020.9159723>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iolts>
dc:title Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document