Understanding the Impact of Cutting in Quantum Circuits Reliability to Transient Faults.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/iolts/CasciolaGD0RM22
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Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/iolts/CasciolaGD0RM22
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bartolomeo_Montrucchio
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Daniel_Oliveira_0002
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Edoardo_Giusto
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Emanuele_Dri
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nadir_Casciola
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Paolo_Rech
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FIOLTS56730.2022.9897308
>
foaf:
homepage
<
https://doi.org/10.1109/IOLTS56730.2022.9897308
>
dc:
identifier
DBLP conf/iolts/CasciolaGD0RM22
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FIOLTS56730.2022.9897308
(xsd:string)
dcterms:
issued
2022
(xsd:gYear)
rdfs:
label
Understanding the Impact of Cutting in Quantum Circuits Reliability to Transient Faults.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bartolomeo_Montrucchio
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Daniel_Oliveira_0002
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Edoardo_Giusto
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Emanuele_Dri
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nadir_Casciola
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Paolo_Rech
>
swrc:
pages
1-7
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/iolts/2022
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/iolts/CasciolaGD0RM22/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/iolts/CasciolaGD0RM22
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/iolts/iolts2022.html#CasciolaGD0RM22
>
rdfs:
seeAlso
<
https://doi.org/10.1109/IOLTS56730.2022.9897308
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/iolts
>
dc:
title
Understanding the Impact of Cutting in Quantum Circuits Reliability to Transient Faults.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document