Robustness of circuits under delay-induced faults : test of AES with the PAFI tool.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/iolts/FauraxTFB07
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Assia_Tria
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fr%E2%88%9A%C2%A9d%E2%88%9A%C2%A9ric_Bancel
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Laurent_Freund
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Olivier_Faurax
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FIOLTS.2007.57
>
foaf:
homepage
<
https://doi.org/10.1109/IOLTS.2007.57
>
dc:
identifier
DBLP conf/iolts/FauraxTFB07
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FIOLTS.2007.57
(xsd:string)
dcterms:
issued
2007
(xsd:gYear)
rdfs:
label
Robustness of circuits under delay-induced faults : test of AES with the PAFI tool.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Assia_Tria
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fr%E2%88%9A%C2%A9d%E2%88%9A%C2%A9ric_Bancel
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Laurent_Freund
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Olivier_Faurax
>
swrc:
pages
185-186
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/iolts/2007
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/iolts/FauraxTFB07/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/iolts/FauraxTFB07
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/iolts/iolts2007.html#FauraxTFB07
>
rdfs:
seeAlso
<
https://doi.org/10.1109/IOLTS.2007.57
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/iolts
>
dc:
title
Robustness of circuits under delay-induced faults : test of AES with the PAFI tool.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document