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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iolts/MakhloufGGKVUWV17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexander_Utz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Diana_Goller>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dirk_Weiler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Franz_Vogt>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Holger_Vogt>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lutz_Gendrisch>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohamed_Makhlouf>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stephan_Kolnsberg>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIOLTS.2017.8046170>
foaf:homepage <https://doi.org/10.1109/IOLTS.2017.8046170>
dc:identifier DBLP conf/iolts/MakhloufGGKVUWV17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIOLTS.2017.8046170 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label Automating wafer-level test of uncooled infrared detectors using wafer-prober. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexander_Utz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Diana_Goller>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dirk_Weiler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Franz_Vogt>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Holger_Vogt>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lutz_Gendrisch>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohamed_Makhlouf>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stephan_Kolnsberg>
swrc:pages 13-16 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iolts/2017>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iolts/MakhloufGGKVUWV17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iolts/MakhloufGGKVUWV17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iolts/iolts2017.html#MakhloufGGKVUWV17>
rdfs:seeAlso <https://doi.org/10.1109/IOLTS.2017.8046170>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iolts>
dc:title Automating wafer-level test of uncooled infrared detectors using wafer-prober. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document