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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iolts/RossiMNKM04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Muccio>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_K._Nieuwland>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Atul_Katoch>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cecilia_Metra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniele_Rossi_0001>
foaf:homepage <http://dx.doi.org/doi.ieeecomputersociety.org%2F10.1109%2FIOLTS.2004.26>
foaf:homepage <https://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.26>
dc:identifier DBLP conf/iolts/RossiMNKM04 (xsd:string)
dc:identifier DOI doi.ieeecomputersociety.org%2F10.1109%2FIOLTS.2004.26 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Muccio>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_K._Nieuwland>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Atul_Katoch>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cecilia_Metra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniele_Rossi_0001>
swrc:pages 135-140 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iolts/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iolts/RossiMNKM04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iolts/RossiMNKM04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iolts/iolts2004.html#RossiMNKM04>
rdfs:seeAlso <https://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.26>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iolts>
dc:title Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document