Concurrent Scan Monitoring and Multi-Pattern Search.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/iolts/Santos00
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Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/iolts/Santos00
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jose_Miguel_Vieira_dos_Santos
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FOLT.2000.856621
>
foaf:
homepage
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https://doi.org/10.1109/OLT.2000.856621
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dc:
identifier
DBLP conf/iolts/Santos00
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dc:
identifier
DOI doi.org%2F10.1109%2FOLT.2000.856621
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dcterms:
issued
2000
(xsd:gYear)
rdfs:
label
Concurrent Scan Monitoring and Multi-Pattern Search.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jose_Miguel_Vieira_dos_Santos
>
swrc:
pages
107-111
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/iolts/2000
>
owl:
sameAs
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>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/iolts/Santos00
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/iolts/ioltw2000.html#Santos00
>
rdfs:
seeAlso
<
https://doi.org/10.1109/OLT.2000.856621
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/iolts
>
dc:
subject
Dependable VLSI, Concurrent test, BST, DFT
(xsd:string)
dc:
title
Concurrent Scan Monitoring and Multi-Pattern Search.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
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rdf:
type
foaf:Document