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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iolts/TsiatouhasHN00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dimitris_Nikolos>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Th._Haniotakis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Y._Tsiatouhas>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FOLT.2000.856619>
foaf:homepage <https://doi.org/10.1109/OLT.2000.856619>
dc:identifier DBLP conf/iolts/TsiatouhasHN00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FOLT.2000.856619 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label A Compact Built-In Current Sensor for IDDQ Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dimitris_Nikolos>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Th._Haniotakis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Y._Tsiatouhas>
swrc:pages 95-99 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iolts/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iolts/TsiatouhasHN00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iolts/TsiatouhasHN00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iolts/ioltw2000.html#TsiatouhasHN00>
rdfs:seeAlso <https://doi.org/10.1109/OLT.2000.856619>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iolts>
dc:subject Design for testability, DFT, Built in current sensors, BICS, IDDQ testing, Current monitoring, Bridging and Stuck-on fault testability (xsd:string)
dc:title A Compact Built-In Current Sensor for IDDQ Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document