Embedding test patterns into Low-Power BIST sequences. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Ioannis_Voyiatzis>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FIOLTS.2007.29>
foaf:homepage	<https://doi.org/10.1109/IOLTS.2007.29>
dc:identifier	DBLP conf/iolts/Voyiatzis07 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FIOLTS.2007.29 (xsd:string)
dcterms:issued	2007 (xsd:gYear)
rdfs:label	Embedding test patterns into Low-Power BIST sequences. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Ioannis_Voyiatzis>
swrc:pages	197-198 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/iolts/2007>
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rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/iolts/iolts2007.html#Voyiatzis07>
rdfs:seeAlso	<https://doi.org/10.1109/IOLTS.2007.29>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/iolts>
dc:subject	Built-In Self Test, Test set embedding, Gray sequences, Low power sequences (xsd:string)
dc:title	Embedding test patterns into Low-Power BIST sequences. (xsd:string)
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