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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ipcv/LinCL10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chung-Yu_Chung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hong-Dar_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wan-Ting_Lin>
dc:identifier DBLP conf/ipcv/LinCL10 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Automated Industrial Inspection of LED Chips Using Multivariate Factor Analysis. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chung-Yu_Chung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hong-Dar_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wan-Ting_Lin>
swrc:pages 283-288 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ipcv/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ipcv/LinCL10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ipcv/LinCL10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ipcv/ipcv2010.html#LinCL10>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ipcv>
dc:title Automated Industrial Inspection of LED Chips Using Multivariate Factor Analysis. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document