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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iros/ChangHL90>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chin-Hui_Hong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P.-R._Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Share-Young_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIROS.1990.262461>
foaf:homepage <https://doi.org/10.1109/IROS.1990.262461>
dc:identifier DBLP conf/iros/ChangHL90 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIROS.1990.262461 (xsd:string)
dcterms:issued 1990 (xsd:gYear)
rdfs:label An intelligent multi-response off-line quality control for semiconductor manufacturing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chin-Hui_Hong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P.-R._Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Share-Young_Lee>
swrc:pages 609-616 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iros/1990>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iros/ChangHL90/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iros/ChangHL90>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iros/iros1990.html#ChangHL90>
rdfs:seeAlso <https://doi.org/10.1109/IROS.1990.262461>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iros>
dc:title An intelligent multi-response off-line quality control for semiconductor manufacturing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document