Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/iros/LiangBARR19
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/iros/LiangBARR19
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Catherine_Achard
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mokrane_Boudaoud
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shuai_Liang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/St%E2%88%9A%C2%A9phane_R%E2%88%9A%C2%A9gnier
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Weibin_Rong
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FIROS40897.2019.8968567
>
foaf:
homepage
<
https://doi.org/10.1109/IROS40897.2019.8968567
>
dc:
identifier
DBLP conf/iros/LiangBARR19
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FIROS40897.2019.8968567
(xsd:string)
dcterms:
issued
2019
(xsd:gYear)
rdfs:
label
Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Catherine_Achard
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mokrane_Boudaoud
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shuai_Liang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/St%E2%88%9A%C2%A9phane_R%E2%88%9A%C2%A9gnier
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Weibin_Rong
>
swrc:
pages
2435-2440
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/iros/2019
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/iros/LiangBARR19/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/iros/LiangBARR19
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/iros/iros2019.html#LiangBARR19
>
rdfs:
seeAlso
<
https://doi.org/10.1109/IROS40897.2019.8968567
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/iros
>
dc:
title
Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document