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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/AlessandrinoCCM22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Di_Salvo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Lombardo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alfio_Russo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Beatrice_Carbone>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bruna_Mazza>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/D._Scarcella>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elisa_Vitanza>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francesco_Cordiano>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mario_Santo_Alessandrino>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Massimo_Boscaglia>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Fiorenza>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/W._Coco>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764423>
foaf:homepage <https://doi.org/10.1109/IRPS48227.2022.9764423>
dc:identifier DBLP conf/irps/AlessandrinoCCM22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48227.2022.9764423 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Di_Salvo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Lombardo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alfio_Russo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Beatrice_Carbone>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bruna_Mazza>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/D._Scarcella>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elisa_Vitanza>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francesco_Cordiano>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mario_Santo_Alessandrino>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Massimo_Boscaglia>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Fiorenza>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/W._Coco>
swrc:pages 61-1 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2022>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2022.html#AlessandrinoCCM22>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48227.2022.9764423>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document