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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/AliKCRPOLMMLHMK20>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matthias_Rudolph>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ricardo_Olivo>
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foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS45951.2020.9128337>
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dcterms:issued 2020 (xsd:gYear)
rdfs:label Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahsa_N._Kalkani>
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swrc:pages 1-9 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/IRPS45951.2020.9128337>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells. (xsd:string)
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rdf:type swrc:InProceedings
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