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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/BeekRKKOCYCCSJC21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Barry_J._O%27Sullivan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Davide_Crotti>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Farrukh_Yasin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gouri_Sankar_Kar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nico_Jossart>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_Carpenter>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sebastien_Couet>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shamin_H._Sharifi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shreya_Kundu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Siddharth_Rao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Simon_Van_Beek>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefan_Cosemans>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Woojin_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS46558.2021.9405209>
foaf:homepage <https://doi.org/10.1109/IRPS46558.2021.9405209>
dc:identifier DBLP conf/irps/BeekRKKOCYCCSJC21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS46558.2021.9405209 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Barry_J._O%27Sullivan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Davide_Crotti>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Farrukh_Yasin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gouri_Sankar_Kar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nico_Jossart>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_Carpenter>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sebastien_Couet>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shamin_H._Sharifi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shreya_Kundu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Siddharth_Rao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Simon_Van_Beek>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefan_Cosemans>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Woojin_Kim>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/BeekRKKOCYCCSJC21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/BeekRKKOCYCCSJC21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2021.html#BeekRKKOCYCCSJC21>
rdfs:seeAlso <https://doi.org/10.1109/IRPS46558.2021.9405209>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document