[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/BerensA21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Judith_Berens>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_Aichinger>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS46558.2021.9405152>
foaf:homepage <https://doi.org/10.1109/IRPS46558.2021.9405152>
dc:identifier DBLP conf/irps/BerensA21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS46558.2021.9405152 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label A straightforward electrical method to determine screening capability of GOX extrinsics in arbitrary, commercially available SiC MOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Judith_Berens>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_Aichinger>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/BerensA21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/BerensA21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2021.html#BerensA21>
rdfs:seeAlso <https://doi.org/10.1109/IRPS46558.2021.9405152>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title A straightforward electrical method to determine screening capability of GOX extrinsics in arbitrary, commercially available SiC MOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document