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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/BognerGWRS22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Bogner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Schl%E2%88%9A%C4%BEnder>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans_Reisinger>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Waltl>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tibor_Grasser>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764496>
foaf:homepage <https://doi.org/10.1109/IRPS48227.2022.9764496>
dc:identifier DBLP conf/irps/BognerGWRS22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48227.2022.9764496 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Bogner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Schl%E2%88%9A%C4%BEnder>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans_Reisinger>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Waltl>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tibor_Grasser>
swrc:pages 1-8 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2022>
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/BognerGWRS22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2022.html#BognerGWRS22>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48227.2022.9764496>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document