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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/BuryCKCFSWL18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adrian_Vaisman_Chasin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dimitri_Linten>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Bury>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacopo_Franco>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kai-Hsin_Chuang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marko_Simicic>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pieter_Weckx>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS.2018.8353541>
foaf:homepage <https://doi.org/10.1109/IRPS.2018.8353541>
dc:identifier DBLP conf/irps/BuryCKCFSWL18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS.2018.8353541 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Self-heating-aware CMOS reliability characterization using degradation maps. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adrian_Vaisman_Chasin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dimitri_Linten>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Bury>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacopo_Franco>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kai-Hsin_Chuang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marko_Simicic>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pieter_Weckx>
swrc:pages 2 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/BuryCKCFSWL18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/BuryCKCFSWL18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2018.html#BuryCKCFSWL18>
rdfs:seeAlso <https://doi.org/10.1109/IRPS.2018.8353541>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Self-heating-aware CMOS reliability characterization using degradation maps. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document