Single pulse short-circuit robustness and repetitive stress aging of GaN GITs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/irps/CastellazziFZOP18
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Single pulse short-circuit robustness and repetitive stress aging of GaN GITs.
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Single pulse short-circuit robustness and repetitive stress aging of GaN GITs.
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