[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/ChangLLCMW15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._C._Chiu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/D._Maji>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/K._Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._N._Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Y._Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Y.-H._Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS.2015.7112700>
foaf:homepage <https://doi.org/10.1109/IRPS.2015.7112700>
dc:identifier DBLP conf/irps/ChangLLCMW15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS.2015.7112700 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label An investigation of capacitance aging model for extreme low-k and high-k dielectrics. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._C._Chiu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/D._Maji>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/K._Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._N._Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Y._Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Y.-H._Lee>
swrc:pages 3 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/ChangLLCMW15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/ChangLLCMW15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2015.html#ChangLLCMW15>
rdfs:seeAlso <https://doi.org/10.1109/IRPS.2015.7112700>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title An investigation of capacitance aging model for extreme low-k and high-k dielectrics. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document