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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/ChangZYJLSYW21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eddy_Simoen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hao_Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hong_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Huaxiang_Yin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Longda_Zhou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qianqian_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wenwu_Wang_0006>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS46558.2021.9405162>
foaf:homepage <https://doi.org/10.1109/IRPS46558.2021.9405162>
dc:identifier DBLP conf/irps/ChangZYJLSYW21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS46558.2021.9405162 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eddy_Simoen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hao_Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hong_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Huaxiang_Yin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Longda_Zhou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qianqian_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wenwu_Wang_0006>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/ChangZYJLSYW21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/ChangZYJLSYW21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2021.html#ChangZYJLSYW21>
rdfs:seeAlso <https://doi.org/10.1109/IRPS46558.2021.9405162>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document