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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/ChasinFBRLSHLK20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adrian_Vaisman_Chasin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alessio_Spessot>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dimitri_Linten>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Bury>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eugenio_Dentoni_Litta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacopo_Franco>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Naoto_Horiguchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Romain_Ritzenthaler>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS45951.2020.9129584>
foaf:homepage <https://doi.org/10.1109/IRPS45951.2020.9129584>
dc:identifier DBLP conf/irps/ChasinFBRLSHLK20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS45951.2020.9129584 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adrian_Vaisman_Chasin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alessio_Spessot>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dimitri_Linten>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Bury>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eugenio_Dentoni_Litta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacopo_Franco>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Naoto_Horiguchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Romain_Ritzenthaler>
swrc:pages 1-6 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2020.html#ChasinFBRLSHLK20>
rdfs:seeAlso <https://doi.org/10.1109/IRPS45951.2020.9129584>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document