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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/ChenKFSOKO21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Sakui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tadashi_Fukuda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Obara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takayuki_Ohba>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tatsuji_Kobayashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Young-Suk_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhwen_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS46558.2021.9405125>
foaf:homepage <https://doi.org/10.1109/IRPS46558.2021.9405125>
dc:identifier DBLP conf/irps/ChenKFSOKO21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS46558.2021.9405125 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Reliability of Wafer-Level Ultra-Thinning down to 3 ¬Ķm using 20 nm-Node DRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Sakui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tadashi_Fukuda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Obara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takayuki_Ohba>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tatsuji_Kobayashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Young-Suk_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhwen_Chen>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2021>
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/ChenKFSOKO21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2021.html#ChenKFSOKO21>
rdfs:seeAlso <https://doi.org/10.1109/IRPS46558.2021.9405125>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Reliability of Wafer-Level Ultra-Thinning down to 3 ¬Ķm using 20 nm-Node DRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document