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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/ChienGCYGHYCKKL22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Ray>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._H._Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._S._Hsu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._W._Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._W._Yeh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/E._K._Lai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._L._Lung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._Y._Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._Y._Ho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/I._T._Kuo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/L._Buzi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lynne_M._Gignac>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matthew_BrightSky>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/N._Gong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_L._Bruce>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/W._Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei-Chih_Chien>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Y._C._Chou>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764481>
foaf:homepage <https://doi.org/10.1109/IRPS48227.2022.9764481>
dc:identifier DBLP conf/irps/ChienGCYGHYCKKL22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48227.2022.9764481 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Ray>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._H._Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._S._Hsu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._W._Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._W._Yeh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/E._K._Lai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._L._Lung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._Y._Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._Y._Ho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/I._T._Kuo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/L._Buzi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lynne_M._Gignac>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matthew_BrightSky>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/N._Gong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_L._Bruce>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/W._Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei-Chih_Chien>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Y._C._Chou>
swrc:pages 7-1 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/ChienGCYGHYCKKL22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/ChienGCYGHYCKKL22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2022.html#ChienGCYGHYCKKL22>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48227.2022.9764481>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document