Modeling Time and Bias Dependence of Classical HCD Mechanism (Peak ISUB Stress) in n-MOSFETs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/irps/DiwakarTM22
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/irps/DiwakarTM22
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Himanshu_Diwakar
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Karansingh_Thakor
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Souvik_Mahapatra
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764505
>
foaf:
homepage
<
https://doi.org/10.1109/IRPS48227.2022.9764505
>
dc:
identifier
DBLP conf/irps/DiwakarTM22
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FIRPS48227.2022.9764505
(xsd:string)
dcterms:
issued
2022
(xsd:gYear)
rdfs:
label
Modeling Time and Bias Dependence of Classical HCD Mechanism (Peak ISUB Stress) in n-MOSFETs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Himanshu_Diwakar
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Karansingh_Thakor
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Souvik_Mahapatra
>
swrc:
pages
55-1
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/irps/2022
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/irps/DiwakarTM22/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/irps/DiwakarTM22
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/irps/irps2022.html#DiwakarTM22
>
rdfs:
seeAlso
<
https://doi.org/10.1109/IRPS48227.2022.9764505
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/irps
>
dc:
title
Modeling Time and Bias Dependence of Classical HCD Mechanism (Peak ISUB Stress) in n-MOSFETs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document