Vertical stack reliability of GaN-on-Si buffers for low-voltage applications.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/irps/FabrisBPZJYDMMZ21
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Brice_De_Jaeger
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Elena_Fabris
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Enrico_Zanoni
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Gaudenzio_Meneghesso
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Matteo_Borga
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Matteo_Meneghini
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ming_Zhao
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Niels_Posthuma
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shuzhen_You
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Stefaan_Decoutere
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FIRPS46558.2021.9405097
>
foaf:
homepage
<
https://doi.org/10.1109/IRPS46558.2021.9405097
>
dc:
identifier
DBLP conf/irps/FabrisBPZJYDMMZ21
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FIRPS46558.2021.9405097
(xsd:string)
dcterms:
issued
2021
(xsd:gYear)
rdfs:
label
Vertical stack reliability of GaN-on-Si buffers for low-voltage applications.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Brice_De_Jaeger
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Elena_Fabris
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Enrico_Zanoni
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Gaudenzio_Meneghesso
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Matteo_Borga
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Matteo_Meneghini
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ming_Zhao
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Niels_Posthuma
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shuzhen_You
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Stefaan_Decoutere
>
swrc:
pages
1-8
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/irps/2021
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/irps/FabrisBPZJYDMMZ21/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/irps/FabrisBPZJYDMMZ21
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/irps/irps2021.html#FabrisBPZJYDMMZ21
>
rdfs:
seeAlso
<
https://doi.org/10.1109/IRPS46558.2021.9405097
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/irps
>
dc:
title
Vertical stack reliability of GaN-on-Si buffers for low-voltage applications.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document