[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/FrutuosoGLKZVDF22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abyga%E2%88%9A%C4%99l_Viey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fred_Gaillard>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jose_Lugo-Alvarez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/L._D._M._Zouknak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Philippe_Ferrari>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rom%E2%88%9A%C2%A9o_Kom_Kammeugne>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tadeu_Mota_Frutuoso>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/W._van_den_Daele>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xavier_Garros>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764550>
foaf:homepage <https://doi.org/10.1109/IRPS48227.2022.9764550>
dc:identifier DBLP conf/irps/FrutuosoGLKZVDF22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48227.2022.9764550 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Ultra-fast CV methods (< 10¬Ķs) for interface trap spectroscopy and BTI reliability characterization using MOS capacitors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abyga%E2%88%9A%C4%99l_Viey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fred_Gaillard>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jose_Lugo-Alvarez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/L._D._M._Zouknak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Philippe_Ferrari>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rom%E2%88%9A%C2%A9o_Kom_Kammeugne>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tadeu_Mota_Frutuoso>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/W._van_den_Daele>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xavier_Garros>
swrc:pages 3 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/FrutuosoGLKZVDF22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/FrutuosoGLKZVDF22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2022.html#FrutuosoGLKZVDF22>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48227.2022.9764550>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Ultra-fast CV methods (< 10¬Ķs) for interface trap spectroscopy and BTI reliability characterization using MOS capacitors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document