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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/GaoMCWZLHCLHEJW20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dengyun_Lei>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haibao_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jianfu_Zhang_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mehzabeen_Mehedi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rui_Gao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Runsheng_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoling_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xinsheng_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yiqiang_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yun_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yunfei_En>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhiyuan_He>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS45951.2020.9129230>
foaf:homepage <https://doi.org/10.1109/IRPS45951.2020.9129230>
dc:identifier DBLP conf/irps/GaoMCWZLHCLHEJW20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS45951.2020.9129230 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dengyun_Lei>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haibao_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jianfu_Zhang_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mehzabeen_Mehedi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rui_Gao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Runsheng_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoling_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xinsheng_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yiqiang_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yun_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yunfei_En>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhiyuan_He>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/GaoMCWZLHCLHEJW20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/GaoMCWZLHCLHEJW20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2020.html#GaoMCWZLHCLHEJW20>
rdfs:seeAlso <https://doi.org/10.1109/IRPS45951.2020.9129230>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document