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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/GonzalezMCAJR20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francesca_Campabadal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francisco_Jim%E2%88%9A%C2%A9nez-Molinos>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Juan_Bautista_Rold%E2%88%9A%C2%B0n>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marcos_Maestro-Izquierdo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mireia_Bargallo_Gonz%E2%88%9A%C2%B0lez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Samuel_Aldana>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS45951.2020.9128961>
foaf:homepage <https://doi.org/10.1109/IRPS45951.2020.9128961>
dc:identifier DBLP conf/irps/GonzalezMCAJR20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS45951.2020.9128961 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francesca_Campabadal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francisco_Jim%E2%88%9A%C2%A9nez-Molinos>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Juan_Bautista_Rold%E2%88%9A%C2%B0n>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marcos_Maestro-Izquierdo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mireia_Bargallo_Gonz%E2%88%9A%C2%B0lez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Samuel_Aldana>
swrc:pages 1-4 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/IRPS45951.2020.9128961>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document