[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/HaiCDLAFKG22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Divay>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Estelle_Lauga-Larroze>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Florian_Cacho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean-Daniel_Arnould>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeremie_Forest>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joycelyn_Hai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vincent_Knopik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xavier_Garros>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764535>
foaf:homepage <https://doi.org/10.1109/IRPS48227.2022.9764535>
dc:identifier DBLP conf/irps/HaiCDLAFKG22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48227.2022.9764535 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Divay>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Estelle_Lauga-Larroze>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Florian_Cacho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean-Daniel_Arnould>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeremie_Forest>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joycelyn_Hai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vincent_Knopik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xavier_Garros>
swrc:pages 4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/HaiCDLAFKG22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/HaiCDLAFKG22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2022.html#HaiCDLAFKG22>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48227.2022.9764535>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document