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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/HauserSVKGBPM22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Vallett>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Byoung_Min>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dave_Brochu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fernando_Guarin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Hauser>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._Srinivasan_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Krishnasamy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/V._Pham>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764575>
foaf:homepage <https://doi.org/10.1109/IRPS48227.2022.9764575>
dc:identifier DBLP conf/irps/HauserSVKGBPM22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48227.2022.9764575 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Vallett>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Byoung_Min>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dave_Brochu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fernando_Guarin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Hauser>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._Srinivasan_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Krishnasamy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/V._Pham>
swrc:pages 5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/HauserSVKGBPM22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/HauserSVKGBPM22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2022.html#HauserSVKGBPM22>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48227.2022.9764575>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document