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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/JiMPOMSBHLGP23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anoop_Mathew>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Brett_Hull>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_J._Lichtenwalner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donald_A._Gajewski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edward_Van_Brunt>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/In-Hwan_Ji>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jae-Hyung_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_W._Palmour>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matthew_McCain>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Neal_Oldham>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shadi_Sabri>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10118095>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10118095>
dc:identifier DBLP conf/irps/JiMPOMSBHLGP23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10118095 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anoop_Mathew>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Brett_Hull>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_J._Lichtenwalner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donald_A._Gajewski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edward_Van_Brunt>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/In-Hwan_Ji>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jae-Hyung_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_W._Palmour>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matthew_McCain>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Neal_Oldham>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shadi_Sabri>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/JiMPOMSBHLGP23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/JiMPOMSBHLGP23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2023.html#JiMPOMSBHLGP23>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10118095>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document