Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/irps/JiangSKSKPUJJKR20
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/irps/JiangSKSKPUJJKR20
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Brandon_Lee
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Dongkyun_Kwon
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hai_Jiang_0005
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hwasung_Rhee
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hyewon_Shim
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hyun-Chul_Sagong
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jinju_Kim
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Junekyun_Park
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sangwoo_Pae
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Taeyoung_Jeong
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Taiki_Uemura
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yongsung_Ji
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yoohwan_Kim
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FIRPS45951.2020.9128322
>
foaf:
homepage
<
https://doi.org/10.1109/IRPS45951.2020.9128322
>
dc:
identifier
DBLP conf/irps/JiangSKSKPUJJKR20
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FIRPS45951.2020.9128322
(xsd:string)
dcterms:
issued
2020
(xsd:gYear)
rdfs:
label
Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Brandon_Lee
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Dongkyun_Kwon
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hai_Jiang_0005
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hwasung_Rhee
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hyewon_Shim
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hyun-Chul_Sagong
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jinju_Kim
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Junekyun_Park
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sangwoo_Pae
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Taeyoung_Jeong
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Taiki_Uemura
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yongsung_Ji
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yoohwan_Kim
>
swrc:
pages
1-5
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/irps/2020
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/irps/JiangSKSKPUJJKR20/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/irps/JiangSKSKPUJJKR20
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/irps/irps2020.html#JiangSKSKPUJJKR20
>
rdfs:
seeAlso
<
https://doi.org/10.1109/IRPS45951.2020.9128322
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/irps
>
dc:
title
Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document